发明名称 Calibration pattern unit
摘要 A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system is formed by combining a plurality of three-dimensionally arranged planes. The calibration pattern unit comprises supporting members each of which has a predetermined surface corresponding to one of the planes, and a calibration pattern in which a predetermined pattern is formed on the predetermined surface of the supporting member. The supporting member can selectively set the calibration pattern unit to a first form for photographing when the correction information is obtained, and a second form for other purposes.
申请公布号 US2004044496(A1) 申请公布日期 2004.03.04
申请号 US20030650619 申请日期 2003.08.28
申请人 OLYMPUS OPTICAL CO., LTD. 发明人 ARAI KAZUHIKO;KOSAKA AKIO;MIYOSHI TAKASHI;TAKAHASHI KAZUHIKO;IWAKI HIDEKAZU
分类号 G01B11/24;G01B11/00;G01B11/03;G01B11/25;H04N17/00;(IPC1-7):G01B7/00;G01B15/00 主分类号 G01B11/24
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