| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory and its test method with which all RAMs can be tested simultaneously in parallel even if a plurality of RAMs having different memory spaces are mounted on the same silicon. SOLUTION: An external address signal and an address signal for test only are provided as a RAM control signal, in the latter case, the number of X, Y addresses of a RAM 3 with the maximum capacity in one chip is made same as the number of those of the other RAMs 4, 5, and allotment of X, Y addresses of the respective RAMs 3∼5 are made same. COPYRIGHT: (C)2004,JPO
|
