发明名称 MULTILAYER INTERCONNECTION BOARD AND SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a multilayer interconnection board which surely permits fine interlayer connection as well as fine wiring pattern formation, and which is high in reliability. <P>SOLUTION: In a multilayer interconnection board, the wiring pattern formed by embedding the same into the interlayer insulating material layer 105 of a connecting layer is connected to a part to be connected 112 of a layer to be connected 111 by a conductor post 107, and a metallic connecting material layer 108. The connecting layer and the layer to be connected is connected by a metallic connection adhesive agent layer 109. In such a multilayer interconnection board, the interlayer insulating material layer 105 is provided with a thermal expansion coefficient of not lower than 15ppm and not higher than 25ppm in the temperature region of -65°C to 150°C. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004071656(A) 申请公布日期 2004.03.04
申请号 JP20020225284 申请日期 2002.08.01
申请人 SUMITOMO BAKELITE CO LTD 发明人 NAKAMURA KENSUKE;ITO SHINICHIRO
分类号 H05K3/46;H01L23/12;(IPC1-7):H05K3/46 主分类号 H05K3/46
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