发明名称 CHEMICAL MECHANICAL POLISHING AND PAD DRESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a pad dressing and chemical mechanical polishing method whereby a removing profile at the center of a wafer can be enhanced without problems regarding costs, complication or control caused by a new design of a polishing head. <P>SOLUTION: The polishing pad is dressed by rotating a pad dresser 100 with respect to the rotating polishing pad, and slurry is supplied to the polishing pad. The wafer is chemically and mechanically polished by rotating the wafer with respect to the rotating polishing pad. The rotating direction of the pad dresser 100, the polishing pad and the wafer is constituted by combination of predetermined rotating directions. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004066450(A) 申请公布日期 2004.03.04
申请号 JP20030283956 申请日期 2003.07.31
申请人 EBARA TECHNOLOGIES INC 发明人 MOLONEY GERARD STEPHEN;WANG HUEY-MING;LAO PETER
分类号 B24B37/04;B24B53/007;H01L21/304 主分类号 B24B37/04
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