| 摘要 |
PROBLEM TO BE SOLVED: To provide a test device and a test method which can test a margin in power supply voltage and also a timing margin in a clock with an easy structure in the test device and the test method. SOLUTION: The power supply voltage V1 and timing of operation reference signals CLK, DQS are varied, and a test program is executed via an information processor 3 on which a memory board 2A is mounted. COPYRIGHT: (C)2004,JPO
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