发明名称 |
Suppression of leakage current in image acquisition |
摘要 |
In a manufacturing process of a display device, hydrogenation in an I layer of photodiodes D1 and D2 is progressed less than that in a channel portion of a pixel TFT, and a defect density due to dangling bonds not terminated in the I layer of the photodiodes D1 and D2 is made higher than a defect density in the channel portion of the pixel TFT. Thus, while suppressing a leakage current of the pixel TFT, the sensitivity of the photodiodes D1 and D2 to light is improved. Moreover, a gate electrode is provided above an i region of a pin-type optical sensor diode with an insulating film interposed therebetween. Thus, a gate voltage can control a threshold of a bias voltage when a current starts to flow into the optical sensor diode and a leakage current is prevented from flowing into the optical sensor diode.
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申请公布号 |
US2004043676(A1) |
申请公布日期 |
2004.03.04 |
申请号 |
US20030635509 |
申请日期 |
2003.08.07 |
申请人 |
TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD. |
发明人 |
TADA MASAHIRO;NAKAMURA TAKASHI;TADA NORIO;YOSHIDA MASAHIRO |
分类号 |
G09G3/36;G02F1/136;H01L21/00;H01L21/336;H01L27/00;H01L27/14;H01L27/146;H01L27/15;H01L29/00;H01L29/786;H01L31/10;H01L31/12;H01R9/22;(IPC1-7):H01R9/22 |
主分类号 |
G09G3/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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