| 摘要 |
The invention relates to a method and a circuit for measuring a voltage and a temperature and for generating a voltage with adjustable temperature dependence. The method according to the invention comprises the following steps: determining a first measured value (M1) for a first forward voltage (U(I1,T)) of a pn-transition, through which a first current (I1) flows, of a semiconductor component; determining a second measured value (M2) for a second forward voltage (U(I2,T)) of the same pn-transition, but through which a second current (I2) flows; calculating a value, which is proportional to the voltage (U0, U(I1,T), U(I2,T)) to be measured, from the determined measured values (M1, M2) from at least one parameter (n) which characterises the pn-transition, and optionally from the desired temperature dependence. The circuit according to the invention comprises an A/D converter (W), a semiconductor component (D) with a pn-transition, and a voltage source for supplying a first and a second current (I1; I2) via the pn-transition, wherein the pn-transition is situated parallel to the input of the A/D converter (W). The output of the A/D converter is connected to an arithmetic circuit.
|
