发明名称 |
METHOD FOR LOCALLY HIGHLY RESOLVED, MASS-SPECTROSCOPIC CHARACTERISATION OF SURFACES USING SCANNING PROBE TECHNOLOGY |
摘要 |
The invention relates to a combined method in which a high-resolution image of a sample surface is recorded by means of scanning force microscopy and the locally high-resolution, chemical nature (which is correlated with this) of the sample surface is measured by means of mass spectroscopy. The surface is chemically analyzed on the basis of laser desorption of a restricted surface area. For this purpose, the surface is illuminated in a pulsed form at each point of interest using the optical near-field principle. The optical near-field principle guarantees analysis with a position resolution which is not diffraction-limited. A hollow tip of the measurement probe that is used allows unambiguous association between the chemical analysis and a selected surface area. The highly symmetrical arrangement allows good transmission of the molecular ions that are produced. |
申请公布号 |
AU2003260246(A1) |
申请公布日期 |
2004.03.03 |
申请号 |
AU20030260246 |
申请日期 |
2003.07.24 |
申请人 |
JPK INSTRUMENTS AG |
发明人 |
DETLEF KNEBEL;MATTHIAS AMREIN |
分类号 |
G01B21/30;G01N27/62;G01N27/64;G01Q30/02;G01Q60/22;H01J49/04 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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