APPARATUS AND SYSTEM FOR MEASURING A PARAMETER WITHIN A CLOSED ENVIRONMENT,申请号EP20000991329-传众专利搜索

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发明名称	APPARATUS AND SYSTEM FOR MEASURING A PARAMETER WITHIN A CLOSED ENVIRONMENT
摘要
申请公布号	EP1238246(B1)	申请公布日期	2004.03.03
申请号	EP20000991329	申请日期	2000.12.18
申请人	J & M HOLDING B.V.	发明人	OOSTHOF, JOHANNES, HENDRIK, JACOB
分类号	G01D5/20;(IPC1-7):G01D5/48	主分类号	G01D5/20
代理机构		代理人
主权项
地址

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