Semiconductor chip test system and test method thereof

摘要

A semiconductor chip test system and test method thereof are provided. The system comprises a plurality of data input/output pins (I/O), a tester (20) for inputting/outputting data through the plurality of data input/output pins; a plurality of semiconductor chips (24) to be tested by the tester; a control circuit (22) for sequentially outputting the output data from each of the plurality of semiconductor chips to the tester during a read operation and simultaneously supplying the input data from the tester to the semiconductor chips during a write operation. <IMAGE>