METHOD AND APPARATUS FOR CONTACTLESS CAPACITIVE TESTING OF INTEGRATED CIRCUITS,申请号EP20020706161-传众专利搜索

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发明名称	METHOD AND APPARATUS FOR CONTACTLESS CAPACITIVE TESTING OF INTEGRATED CIRCUITS
摘要
申请公布号	EP1393090(A2)	申请公布日期	2004.03.03
申请号	EP20020706161	申请日期	2002.02.05
申请人	SUN MICROSYSTEMS, INC.	发明人	COATES, WILLIAM;BOSNYAK, ROBERT;SUTHERLAND, IVAN
分类号	G01R31/303;(IPC1-7):G01R31/312	主分类号	G01R31/303
代理机构		代理人
主权项
地址

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