| 摘要 |
In a defect information management method and apparatus of the present invention, a defect list contains a sequence of sets of first defect items with respective offset addresses thereof, each first defect item indicating a location of one of first defects on the storage medium, each of the offset addresses, exclusive of the final one, indicating a relative location of a following one of the corresponding set of first defect items for the offset address in the sequence from a beginning of the defect list. A second defect item is added to an end of the defect list when a second defect in a portion of the storage medium inclusive of a location identified by one of the sets of first defect items is detected. An offset address of the second defect item with respect to the beginning of the defect list is calculated. The offset address of the one of the sets of first defect items is changed to the calculated offset address of the second defect item, so that the second defect can be located by using the resulting defect list.
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