发明名称 Plasma processing method and plasma processing apparatus
摘要 Plasma is generated in a vacuum processing apparatus and a high-frequency voltage is applied to a lower electrode on which a wafer is placed. The high-frequency voltage applied to the lower electrode is subjected to periodical on-off modulation, the on-off duty ratio of which is determined for each wafer or each plurality of wafers, to carry out plasma processing on the wafer. As a result, in the plasma processing carried out on the wafer, the wafer is fabricated with a high degree of reproducibility by suppressing variations in fabricated-line dimension from wafer to wafer without decreasing the throughput.
申请公布号 US6700090(B2) 申请公布日期 2004.03.02
申请号 US20020229034 申请日期 2002.08.28
申请人 发明人
分类号 H01J37/32;(IPC1-7):B23K9/00 主分类号 H01J37/32
代理机构 代理人
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