发明名称 Method for increasing the capacitance in a storage trench
摘要 In a method for forming a trench capacitor a first layer of silicon oxide is deposited in a storage trench and a layer of silicon is deposited over the first layer by a chemical vapor deposition process. A layer of an oxidizable metal is deposited over the layer of silicon. The layer of silicon and the layer of the oxidizable metal are subsequently oxidized to form a layer of silicon oxide and metal oxide.
申请公布号 US6699747(B2) 申请公布日期 2004.03.02
申请号 US20020298394 申请日期 2002.11.18
申请人 INFINEON TECHNOLOGIES AG 发明人 RUFF ALEXANDER;KEGEL WILHELM;KARCHER WOLFRAM;SCHREMS MARTIN
分类号 H01L21/02;H01L21/316;H01L21/334;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/02
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