发明名称 |
Method for increasing the capacitance in a storage trench |
摘要 |
In a method for forming a trench capacitor a first layer of silicon oxide is deposited in a storage trench and a layer of silicon is deposited over the first layer by a chemical vapor deposition process. A layer of an oxidizable metal is deposited over the layer of silicon. The layer of silicon and the layer of the oxidizable metal are subsequently oxidized to form a layer of silicon oxide and metal oxide.
|
申请公布号 |
US6699747(B2) |
申请公布日期 |
2004.03.02 |
申请号 |
US20020298394 |
申请日期 |
2002.11.18 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
RUFF ALEXANDER;KEGEL WILHELM;KARCHER WOLFRAM;SCHREMS MARTIN |
分类号 |
H01L21/02;H01L21/316;H01L21/334;H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|