发明名称 Single chip pad oxide layer growth process
摘要 A single chip pad oxide layer growth process is disclosed. First, a silicon chip is sent into a reaction chamber, which is filled with hydrogen and oxygen. A rapid thermal process is employed to increase the temperature inside the chamber to about 850° C. to 1100° C. to grow a SiO2 layer. The error on the final temperature after the rapid thermal process can be controlled to fluctuate within one to two degrees.
申请公布号 US6699796(B2) 申请公布日期 2004.03.02
申请号 US20020170449 申请日期 2002.06.14
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 SU CHIN-TA
分类号 H01L21/316;(IPC1-7):H01L21/469 主分类号 H01L21/316
代理机构 代理人
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