发明名称 |
Single chip pad oxide layer growth process |
摘要 |
A single chip pad oxide layer growth process is disclosed. First, a silicon chip is sent into a reaction chamber, which is filled with hydrogen and oxygen. A rapid thermal process is employed to increase the temperature inside the chamber to about 850° C. to 1100° C. to grow a SiO2 layer. The error on the final temperature after the rapid thermal process can be controlled to fluctuate within one to two degrees.
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申请公布号 |
US6699796(B2) |
申请公布日期 |
2004.03.02 |
申请号 |
US20020170449 |
申请日期 |
2002.06.14 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
SU CHIN-TA |
分类号 |
H01L21/316;(IPC1-7):H01L21/469 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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