发明名称 BURN-IN/FINAL TEST METHOD FOR IMPROVING YIELD OF HARD DISK DRIVE FABRICATION PROCESS
摘要 PURPOSE: A burn-in/final test method for improving the yield of an HDD(Hard Disk Drive) fabrication process is provided to simultaneously perform a burn-in test process for previously searching a defect to avoid the defect and a final test process for confirming whether an HDD set is normally processed without a defect, thereby improving the yield of an HDD fabrication process. CONSTITUTION: When burn-in and final test commands are received, plural test computers perform burn-in tests for a plurality of HDDs(700). A host computer detects whether the burn-in tests of the test computers are completed(710). If so, the host computer receives burn-in test results on the HDDs from the test computers to store the results, and outputs result values to a display(720,730). The host computer generates a control command for a final test of testing a defect processing state(740). The host computer detects whether the test computers complete the final test(750). If so, the host computer receives final test results to store the results, and outputs result values to the display(760,770).
申请公布号 KR100422426(B1) 申请公布日期 2004.03.02
申请号 KR19960054489 申请日期 1996.11.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JE RYONG
分类号 G11B21/02;(IPC1-7):G11B21/02 主分类号 G11B21/02
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