发明名称 Semiconductor device
摘要 A silicone resin for sealing a semiconductor chip. A cured silicone resin, which is obtained by curing the silicone resin at a given temperature, has a percent elongation, after fracture, measured at a room temperature, not less than 4% of a penetration number at room temperature. A semiconductor device sealed with the silicone resin, when subjected to a heat cycle or a vibration test, provides resistance to cracking, forming of voids, and interfacial peeling-off. The cured silicone resin may have a penetration number not less than 10 and not more than 80 and a loss elasticity not less than 17% of the storage elasticity. A resin member made of the cured silicone resin and sealing a semiconductor chip may include a filler, such as silica or alumina, having a coefficient of linear thermal expansion lower than that of the cured silicone resin.
申请公布号 US6700073(B2) 申请公布日期 2004.03.02
申请号 US20010970029 申请日期 2001.10.04
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HIRAMATSU SEIKI;YANAURA SATOSHI;KOGA MASUO;FUJIOKA HIROFUMI
分类号 H01L23/28;H01L23/24;H01L23/29;H01L25/07;H01L25/18;(IPC1-7):H05K1/00 主分类号 H01L23/28
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