发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a capacitor of a semiconductor device is provided to be capable of simplifying the forming process. CONSTITUTION: A mold insulating layer(107) and a hard mask(108) are sequentially formed at the upper portion of a semiconductor substrate(101). A plurality of holes(109a) are formed on the resultant structure by sequentially patterning the hard mask and the mold insulating layer. An storage node layer(110) is formed along the entire surface of the resultant structure. Then, a capping insulating layer(111) is formed at the upper portion of the storage node layer for completely filling the holes. A plurality of storage nodes and capping insulating patterns are formed at the inner portions of the holes by carrying out a planarization process on the resultant structure using a one-step CMP(Chemical Mechanical Polishing) process.
申请公布号 KR20040017881(A) 申请公布日期 2004.03.02
申请号 KR20020049803 申请日期 2002.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, CHANG GI;PARK, JEONG HEON;PARK, YEONG RAE
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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