| 摘要 |
FIELD: measurement technology. SUBSTANCE: invention is related to automated systems designed to test electrical parameters of hardware in process of approval and presentation tests. In correspondence with invention tested electrical value of hardware is specified, sequence of controlling signals and initial data are formed for its testing, these data are amplified and converted from digital to analog form, frequency, amplitude and duration of defined actions are formed and fed to object of test. At same time specified supply voltage is formed and fed to object of test, value of tested electrical quantity is taken in the form of output signal of hardware which is converted from analog to digital form. Digital signal is processed to establish actual value of tested electrical quantity and this value is compared with required value. Automated system testing electrical parameters of electron equipment incorporates controlling personal computer 1, object 4 of test, buffering unit 7, optron decoupler 8, recording control unit 9, address decoder 10, programmable timer 11, digital-to-analog converter15, unit 16 of control registers, analog-to-digital converter 17, command former 12, unit 13 of commutator of input signals, unit 14 of commutator of output signals, adjustable power supply unit 5 and printer 6. EFFECT: shortened testing time, enhanced authenticity of results of tests of instrumentation. 4 dwg |
