发明名称 METHOD FOR MANUFACTURING SUBSTRATE FOR SEMICONDUCTOR DEVICE, SUBSTRATE FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a substrate for a semiconductor device having a low defect density over a wide area. SOLUTION: A porous anodized alumina film 3 having a number of micropores is provided on a base substrate 1. A large number of microholes 1b are formed on the surface of the base substrate 1 by subjecting the surface of the base substrate 1 to etching treatment by using the alumina film 3 as a mask. The alumina film 3 is removed and thereafter a GaN layer 2 is formed by crystal growth on the surface of the base substrate 1. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004059325(A) 申请公布日期 2004.02.26
申请号 JP20020194637 申请日期 2002.07.03
申请人 FUJI PHOTO FILM CO LTD 发明人 WADA MITSUGI;KUNIYASU TOSHIAKI;FUKUNAGA TOSHIAKI;HOTTA YOSHINORI
分类号 C30B25/04;C30B29/38;H01L29/201;H01S5/323;H01S5/343;(IPC1-7):C30B25/04 主分类号 C30B25/04
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