发明名称 |
METHOD FOR MANUFACTURING SUBSTRATE FOR SEMICONDUCTOR DEVICE, SUBSTRATE FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To obtain a substrate for a semiconductor device having a low defect density over a wide area. SOLUTION: A porous anodized alumina film 3 having a number of micropores is provided on a base substrate 1. A large number of microholes 1b are formed on the surface of the base substrate 1 by subjecting the surface of the base substrate 1 to etching treatment by using the alumina film 3 as a mask. The alumina film 3 is removed and thereafter a GaN layer 2 is formed by crystal growth on the surface of the base substrate 1. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004059325(A) |
申请公布日期 |
2004.02.26 |
申请号 |
JP20020194637 |
申请日期 |
2002.07.03 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
WADA MITSUGI;KUNIYASU TOSHIAKI;FUKUNAGA TOSHIAKI;HOTTA YOSHINORI |
分类号 |
C30B25/04;C30B29/38;H01L29/201;H01S5/323;H01S5/343;(IPC1-7):C30B25/04 |
主分类号 |
C30B25/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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