| 摘要 |
PROBLEM TO BE SOLVED: To provide an in-circuit tester and a printed board test method which further reduce the possibility for a product which is originally a nondefective to be determined as a defective and mixed into detective products owing to imperfect contact of probe pins. SOLUTION: This in-circuit tester is provided with upper and lower fixtures 1, 2 on which probe pins 3, 6 which are brought into contact with a board 20 to be inspected are arranged, by moving the fixtures 1, 2 and the board 20 relatively, and bringing the probe pins 3, 6 into contact with the board 20. The fixtures 2 are provided with positioning pins 7a, 7b for positioning the board 20, and the positioning pins 7a, 7b are united to moving means 10a, 10b which finely move the board 20 to move its contact positions with respect to the probe pins 3, 6. COPYRIGHT: (C)2004,JPO
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