发明名称 STRUCTURE AND METHOD FOR MANUFACTURING BURIED DRAM BY SOI WITH PATTERN HAVING VERTICAL DEVICE CELL
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon-on-insulator (SOI) method with a pattern for manufacturing a composite integrated circuit having both of a logic circuit part and a buried dynamic random access memory (DRAM) array part. <P>SOLUTION: The method includes a step to form a buried oxide layer BOX at the logic circuit part 18 of a substrate, which is not masked by a first mask, by injecting oxygen and a step to apply etching to isolation trenches inside the array part 17 and the logic circuit part 18 by a second mask. The first mask can additionally protect the array part 17 when the corners of the device inside the logic circuit part 18 are rounded. The second mask can additionally protect the logic circuit part 18 when the injection inside the array part 17 is executed. A DRAM cell is formed on a bulk part of the substrate in a state of including at least one SOI device having the round corners and at least one DRAM cell having a vertical path gate. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004064092(A) 申请公布日期 2004.02.26
申请号 JP20030280459 申请日期 2003.07.25
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 DIVAKARUNI RAMACHANDRA;MANDELMAN JACK A
分类号 H01L21/8242;H01L21/38;H01L27/108;H01L27/12 主分类号 H01L21/8242
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