| 发明名称 |
TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS AND DEVICE FOR IT |
| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a new total reflection X-ray fluorescence analysis method and a device for it capable of achieving an ultramicroanalysis with excellent energy resolution and detection efficiency. <P>SOLUTION: Spectroscopy of fluorescent X-rays emitted from a sample in a total reflection condition or its periphery is carried out by means of a curved crystal 1. <P>COPYRIGHT: (C)2004,JPO</p> |
| 申请公布号 |
JP2004061129(A) |
申请公布日期 |
2004.02.26 |
| 申请号 |
JP20020215631 |
申请日期 |
2002.07.24 |
| 申请人 |
NATIONAL INSTITUTE FOR MATERIALS SCIENCE |
发明人 |
SAKURAI KENJI;EBA HIROMI |
| 分类号 |
G01N23/223;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
| 代理机构 |
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