发明名称 WET ETCHING TREATMENT APPARATUS AND WET ETCHING EVALUATION METHOD USING THE TREATMENT APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a wet etching treatment apparatus by which the etching distribution inside the face of the substrate to be treated can visually be observed. <P>SOLUTION: The wet etching treatment apparatus has a holding means of almost horizontally holding the substrate to be treated, an etching treatment liquid feeding means of feeding an etching treatment liquid to the surface of the held substrate to be treated, and a rotary driving means of rotating the holding means so as to rotate the held substrate to be treated inside the face. The wet etching treatment apparatus has a photographing means 7 of photographing the surface of the substrate to be treated at the optional point of time in which wet etching treatment is performed, and an observing means 15 of monitoring a picture photographed by the photographing means 7. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004060016(A) 申请公布日期 2004.02.26
申请号 JP20020221235 申请日期 2002.07.30
申请人 HOYA CORP 发明人 YAMADA TAKAYUKI
分类号 C23F1/00;G03F1/38;G03F1/44;G03F1/68;G03F1/80;H01L21/027;H01L21/306;H01L21/66;(IPC1-7):C23F1/00;G03F1/08 主分类号 C23F1/00
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