发明名称 METHOD FOR FORMING THIN FILM PATTERN AND METHOD FOR FORMING MAGNETORESISTANCE EFFECT ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method for easily forming a minute thin film pattern with high accuracy and to provide a method for forming a magnetoresistance effect element by using the forming method of a thin film pattern. SOLUTION: A resist pattern is heat treated in a heating process at a temperature higher than the temperature in the succeeding process so that the resist pattern accurately maintains its profile in the succeeding process without deformation. Thereby, an isolated or open-type thin film pattern in a minute size can be easily formed with high accuracy. Since the resist pattern used as an etching mask and the resist pattern used as a lift-off mask are made common for use, the manufacturing processes can be simplified and an MR element can be easily formed with high accuracy without causing misalignment. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004062017(A) 申请公布日期 2004.02.26
申请号 JP20020222757 申请日期 2002.07.31
申请人 TDK CORP 发明人 UEJIMA SATOSHI
分类号 G03F7/40;G03F7/26;G11B5/39;H01L21/027;H01L43/08;H01L43/12;(IPC1-7):G03F7/40 主分类号 G03F7/40
代理机构 代理人
主权项
地址