ELECTRICAL INSPECTION METHOD AND MANUFACTURING METHOD OF SEMICONDUCTOR DISPLAY DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an electrical inspection method of a semiconductor display device which confirms whether signal input into a pixel and charge retention in a retention volume are performed normally without using a video signal wire as a route for reading the charge and without providing an inspection special-purpose circuit. SOLUTION: A power supply wire which is a supply route of a supply voltage is used as the route for reading the charge. To put it concretely, this method is characterized by using the power supply wire connectable to the signal wire as the route for input of an inspection signal into the retention volume of each pixel and for reading the charge from the retention volume of each pixel. COPYRIGHT: (C)2004,JPO