发明名称 |
Atomic layer deposition method and semiconductor device fabricating apparatus having rotatable gas injectors |
摘要 |
The present invention discloses an ALD method including: respectively loading a plurality of substrates into a plurality of reaction cells, the plurality of reaction cells being disposed in a reaction chamber isolated from an exterior condition; alternately and repeatedly applying various vapor substances onto each substrate such that a thin film is formed on each substrate, wherein a plurality of vapor injection pipes each injecting one of the vapor substances periodically scans over each substrate to apply the various vapor substances alternately and repeatedly onto each substrate. In another aspect, the present invention discloses a semiconductor device fabricating apparatus including: a plurality of susceptors on which the same number of substrates are respectively mounted; a reaction chamber isolating all the substrates on the plurality of susceptors from an exterior condition; a plurality of vapor injection pipes disposed over the substrates, each vapor injection pipe relatively rotating with respect to the substrates and periodically applying a vapor substance onto each substrate; a plurality of exhausting portion each disposed near a corresponding susceptor to exhaust a remaining vapor substance out of the reaction chamber.
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申请公布号 |
US2004035362(A1) |
申请公布日期 |
2004.02.26 |
申请号 |
US20030645169 |
申请日期 |
2003.08.19 |
申请人 |
HWANG CHUL-JU;SHIM KYUNG-SIK |
发明人 |
HWANG CHUL-JU;SHIM KYUNG-SIK |
分类号 |
H01L21/205;C23C16/44;C23C16/455;(IPC1-7):C23C16/00 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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