发明名称 METHOD FOR MANUFACTURING FLOATING GATE OF NON-VOLATILE MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a floating gate of a non-volatile memory device is provided to secure a program recording and erasing characteristic and improve electrical characteristics by sharply forming the edge portion of the floating gate. CONSTITUTION: A conductive layer(104b) is formed at the upper portion of a semiconductor substrate(100). A nitride pattern is formed on the resultant structure for partially exposing the conductive layer. An etching process is carried out for roundly forming a predetermined portion of the conductive layer. An oxide layer is uniformly formed at the upper portion of the resultant structure. A spacer(110a) is formed at both sidewalls of the nitride pattern by carrying out an etch-back process. A source line(116) is formed between spacers for being electrically connected with the semiconductor substrate.
申请公布号 KR20040017125(A) 申请公布日期 2004.02.26
申请号 KR20020049254 申请日期 2002.08.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, JU JIN;HWANG, JAE SEONG;KIM, JAE U
分类号 H01L21/8247;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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