发明名称 |
METHOD FOR MANUFACTURING FLOATING GATE OF NON-VOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: A method for manufacturing a floating gate of a non-volatile memory device is provided to secure a program recording and erasing characteristic and improve electrical characteristics by sharply forming the edge portion of the floating gate. CONSTITUTION: A conductive layer(104b) is formed at the upper portion of a semiconductor substrate(100). A nitride pattern is formed on the resultant structure for partially exposing the conductive layer. An etching process is carried out for roundly forming a predetermined portion of the conductive layer. An oxide layer is uniformly formed at the upper portion of the resultant structure. A spacer(110a) is formed at both sidewalls of the nitride pattern by carrying out an etch-back process. A source line(116) is formed between spacers for being electrically connected with the semiconductor substrate.
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申请公布号 |
KR20040017125(A) |
申请公布日期 |
2004.02.26 |
申请号 |
KR20020049254 |
申请日期 |
2002.08.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, JU JIN;HWANG, JAE SEONG;KIM, JAE U |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
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地址 |
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