发明名称 |
System, method, and apparatus for testing a head gimbal assembly |
摘要 |
The invention relates to a method and a system for testing a head gimbal assembly, the system comprising means (54) for inputting a control command to perform a long seek operation, means (55) for measuring the mechanical frequency response of the head gimbal assembly to the long seek operation, and means (57) for comparing the frequency response to a master frequency response (58).
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申请公布号 |
US2004036996(A1) |
申请公布日期 |
2004.02.26 |
申请号 |
US20030614979 |
申请日期 |
2003.07.08 |
申请人 |
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. |
发明人 |
KRAUSE RAINER KLAUS;MAEHRINGER-KUNZ EDGAR |
分类号 |
G11B5/55;G11B21/08;(IPC1-7):G11B21/02 |
主分类号 |
G11B5/55 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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