发明名称 System, method, and apparatus for testing a head gimbal assembly
摘要 The invention relates to a method and a system for testing a head gimbal assembly, the system comprising means (54) for inputting a control command to perform a long seek operation, means (55) for measuring the mechanical frequency response of the head gimbal assembly to the long seek operation, and means (57) for comparing the frequency response to a master frequency response (58).
申请公布号 US2004036996(A1) 申请公布日期 2004.02.26
申请号 US20030614979 申请日期 2003.07.08
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 KRAUSE RAINER KLAUS;MAEHRINGER-KUNZ EDGAR
分类号 G11B5/55;G11B21/08;(IPC1-7):G11B21/02 主分类号 G11B5/55
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