Position determination system

摘要

A measurement scale (20) is movable in plane x relative to a mask (10) and photodetector (30). When a pattern of apertures in the mask (10) are in correlation with a pattern of apertures e.g. a reference mark in the scale (20) then light bands a b and c may propagate to the detector (30). The relative sizes of the patterns is such that the light bands converge at the detector (30). Other embodiments show light divergent and light inversion correlation of incongruent patterns.