发明名称 Semiconductor device with LDD structure and process of manufacturing the same
摘要 A semiconductor device comprises: gate electrode formed on a semiconductor substrate through the intervention of a gate insulating film; and a source/drain region provided with a silicide film on its surface and formed in the semiconductor substrate, wherein the source/drain region has an LDD region whose surface is partially or entirely tapered and an interface between the semiconductor substrate and the silicide film in the source/drain region is located higher than a surface of the semiconductor substrate below the gate electrode. <IMAGE>
申请公布号 EP1152470(A3) 申请公布日期 2004.02.25
申请号 EP20010304019 申请日期 2001.05.02
申请人 SHARP KABUSHIKI KAISHA 发明人 MORIMOTO, HIDENORI;ADAN, ALBERTO O.
分类号 H01L21/28;H01L21/336;H01L21/762;H01L21/8238;H01L29/78 主分类号 H01L21/28
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