发明名称 |
NITRIDE SEMICONDUCTOR LIGHT EMITTING DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A nitride semiconductor light emitting device is provided to improve capacity and guarantee reliability by reducing a crystal defect generated by a difference in a thermal expansion coefficient and a lattice constant between a GaN-based single crystal layer grown on a substrate and the substrate. CONSTITUTION: The substrate is prepared. A GaN-based buffer thin film is formed on the substrate. An AlyGa1-yN/GaN short period superlattice(SPS) layer of a sandwich structure is formed on an undoped GaN thin film or an In-doped GaN thin film which is formed on the buffer thin film(wherein 0<=y<=1). The first electrode layer of an n-GaN layer is formed on the AlyGa1-yN/GaN SPS layer. An active layer of a multi-quantum well structure is formed on the first electrode layer. The second electrode layer of a p-GaN layer is formed on the active layer.
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申请公布号 |
KR20040016723(A) |
申请公布日期 |
2004.02.25 |
申请号 |
KR20020049009 |
申请日期 |
2002.08.19 |
申请人 |
LG INNOTEC CO., LTD. |
发明人 |
LEE, SEOK HEON |
分类号 |
H01L21/20;H01L33/00;H01L33/04;H01L33/12;(IPC1-7):H01L33/00 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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