| 摘要 |
An arrangement and a method are provided for replacing defective units, which can be any desired unit of a chip (e.g., arithmetic and logic units), with a function unit. The arrangement and the method provide for performing self-tests more easily, less expensively and before or during a running of an application program. Fault tolerance is greatly enhanced during operation, which is advantageous for failure-critical applications such as in power plants, aviation, space travel or the military, for example. |
