发明名称 Electrostatic discharge protection device for semiconductor integrated circuit, method for producing the same, and electrostatic discharge protection circuit using the same
摘要 An electrostatic discharge protection device is provided at an input or output of a semiconductor integrated circuit for protecting an internal circuit from an electrostatic surge flowing into or out of the integrated circuit. The electrostatic discharge protection device may include a thyristor, and a trigger diode for triggering the thyristor (e.g., with a low voltage). The trigger diode may include an n-type cathode high impurity concentration region; a p-type anode high impurity concentration region; and an insulator section for electrically insulating a silicide layer formed on a surface of the cathode region from another silicide layer formed on a surface of the anode region.
申请公布号 US6696730(B2) 申请公布日期 2004.02.24
申请号 US20010003321 申请日期 2001.12.06
申请人 SHARP KABUSHIKI KAISHA 发明人 KAWAZOE HIDECHIKA;AOKI EIJI;HSU SHENG TENG;FUJII KATSUMASA
分类号 H01L21/332;H01L21/822;H01L21/8238;H01L27/02;H01L27/04;H01L27/092;H01L29/74;H01L29/866;(IPC1-7):H01L23/62 主分类号 H01L21/332
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