发明名称 LASER DIODE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A laser diode and a fabricating method thereof are provided to improve an interfacial characteristic and reduce leakage current by forming a current confinement layer on a selected region. CONSTITUTION: A first clad layer(12), an active layer(14), and a second clad layer(16) are sequentially grown on a substrate(11). A SiO2 layer is deposited on the second clad layer. An upper surface of the second clad layer is exposed by removing partially the SiO2 layer. A diffusion barrier is formed on the upper surface of the SiO2 layer and the exposed surface of the second clad layer. A current confinement layer(17) is formed by diffusing Si of the SiO2 layer to the second clad layer. The residual SiO2 layer and the diffusion barrier are removed therefrom. A cap layer(18) is grown thereon.
申请公布号 KR100421335(B1) 申请公布日期 2004.02.23
申请号 KR19960025187 申请日期 1996.06.28
申请人 INSTITUTE INFORMATION TECHNOLOGY ASSESSMENT;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, NAM HEON;KIM, SEONG HEON
分类号 H01S5/30;(IPC1-7):H01S5/30 主分类号 H01S5/30
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