发明名称 ALIGN STRUCTURE OF SHADOW RING AND DEPOSITION RING OF SPUTTERING APPARATUS
摘要 PURPOSE: An align structure of a shadow ring and a deposition ring of a sputtering apparatus is provided to exclude the use of a dummy wafer by making the align structure of an unevenness type, and to prevent the shadow ring from being separated by improving the firmness of the align structure. CONSTITUTION: The shadow ring(10) is located on a chamber to prevent a wafer chuck from being etched. The deposition ring(30) determines the placement position of the wafer, installed under the shadow ring while being capable of moving up and down. A protrusion(12) is formed on one of the confronting surfaces of the shadow ring and the deposition ring. A concave groove(32) into which the protrusion is inserted is formed on the other of the confronting surfaces.
申请公布号 KR20040016068(A) 申请公布日期 2004.02.21
申请号 KR20020048265 申请日期 2002.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, TAE YEONG
分类号 H01L21/203;(IPC1-7):H01L21/203 主分类号 H01L21/203
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