发明名称 |
ALIGN STRUCTURE OF SHADOW RING AND DEPOSITION RING OF SPUTTERING APPARATUS |
摘要 |
PURPOSE: An align structure of a shadow ring and a deposition ring of a sputtering apparatus is provided to exclude the use of a dummy wafer by making the align structure of an unevenness type, and to prevent the shadow ring from being separated by improving the firmness of the align structure. CONSTITUTION: The shadow ring(10) is located on a chamber to prevent a wafer chuck from being etched. The deposition ring(30) determines the placement position of the wafer, installed under the shadow ring while being capable of moving up and down. A protrusion(12) is formed on one of the confronting surfaces of the shadow ring and the deposition ring. A concave groove(32) into which the protrusion is inserted is formed on the other of the confronting surfaces.
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申请公布号 |
KR20040016068(A) |
申请公布日期 |
2004.02.21 |
申请号 |
KR20020048265 |
申请日期 |
2002.08.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, TAE YEONG |
分类号 |
H01L21/203;(IPC1-7):H01L21/203 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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