| 摘要 |
PURPOSE: A system for simultaneously testing various types of semiconductor devices is provided to simultaneously test the various types of semiconductor devices in parallel by using a plurality of test stations, thereby saving the time and cost required for testing the various types of semiconductor devices. CONSTITUTION: A system for simultaneously testing various types of semiconductor devices includes a plurality of test stations(230,260), a plurality of test pattern generators(210,250) and a plurality of comparators(220,240). The plurality of test stations(230,260) performs the tests of the plurality of semiconductor devices. The plurality of test pattern generators(210,250) generates the test patterns supplied to the semiconductor devices on a corresponding test station in response to the test command supplied from a host and an expected data. And, the plurality of comparators(220,240) compare the expected data with the data outputted from the semiconductor devices on the corresponding test stations. Each of the semiconductor devices arranged on the test stations(230,260) is a different type.
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