发明名称 SCHOTTKY BARRIER TUNNEL TRANSISTOR(SBTT) USING THIN SOI LAYER AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A SBTT(Schottky Barrier Tunnel Transistor) using a thin SOI(Silicon On Insulator) layer and a manufacturing method thereof are provided to be capable of restraining short channel effect and preventing leakage current. CONSTITUTION: A SBTT is provided with a substrate(110) and a buried oxide layer(120) formed on the substrate. At this time, a groove portion is formed on the buried oxide layer. The SBTT further includes a thin SOI layer(130) formed across the upper portion of the groove portion, an insulating layer for enclosing the SOI layer, a gate(150a) formed at the upper portion of the insulating layer, and a source/drain region(160) formed at both sidewalls of the gate. At this time, the source/drain region are made of a silicide layer. Preferably, the groove portion is filled with a conductive layer(150b).
申请公布号 KR20040015417(A) 申请公布日期 2004.02.19
申请号 KR20020047506 申请日期 2002.08.12
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 CHO, WON JU;JANG, MUN GYU;JUNG, U SEOK;LEE, SEONG JAE;PARK, GYEONG WAN
分类号 H01L29/423;H01L29/45;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L27/12 主分类号 H01L29/423
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