发明名称 METHOD AND ARRANGEMENT FOR MEASURING IMPURITIES
摘要 The invention relates to a method and arrangement for automatically measuring impurities in a sample. In the solution, the sample (100) is lifted in such a manner that of the sample (100), at least the part to be measured is suspended freely without support. Cameras (104, 106) film the part to be measured of the sample (100) from a direction other than the vertical direction. An automatic image-processing device (112) measures the impurities in the sample in at least one image formed by at least one camera (104, 106).
申请公布号 WO2004015403(A1) 申请公布日期 2004.02.19
申请号 WO2003FI00592 申请日期 2003.08.05
申请人 METSO AUTOMATION OY;SALOPURO, ANTTI;SAPPINEN, MIKA;SUISTOMAA, HEIKKI 发明人 SALOPURO, ANTTI;SAPPINEN, MIKA;SUISTOMAA, HEIKKI
分类号 G01N21/88 主分类号 G01N21/88
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