| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a relieving method for a memory module in which a defective memory cell can be relieved without replacing a volatile memory decided as defective in an electrical test of a memory module and a memory module. <P>SOLUTION: Defective device information for deciding a defective row address and a defective column address in accordance with the memory cell of a volatile memory discriminated as defective, and a volatile memory discriminated as defective is stored in a nonvolatile memory, at the time of starting a system, a defective row address, a defective column address stored in the nonvolatile memory, and the defective device information are transferred to the volatile memory, the volatile memory holds these information, when a address corresponding to a memory cell of the volatile memory discriminated as defective based on the defective row address and the defective column address held by the volatile memory, and defective device information is inputted, access for a redundant memory cell is performed instead of the memory cell. <P>COPYRIGHT: (C)2004,JPO |
