发明名称 SUBSTRATE FOR NITRIDE SEMICONDUCTOR AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate for a nitride semiconductor which can be increased in area and is low cost, and which can increase the orientation property of a crystal formed thereon. <P>SOLUTION: A nitrogen plasma 15 is radiated on a quartz glass substrate 11, to obtain a substrate 10 for a nitride semiconductor which is such that a silicon nitride layer 12 is formed on a front surface of the quartz glass substrate 11. By forming a nitride semiconductor layer such as GaN on the substrate, the nitride semiconductor obtains an outstanding c-axis orientation. The use of this substrate for a nitride semiconductor makes it possible to manufacture a nitride semiconductor using a quartz glass substrate which can be increased in area and reduced in cost than a sapphire substrate or an SiC substrate which has been used for a GaN semiconductor in the past. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004055811(A) 申请公布日期 2004.02.19
申请号 JP20020211017 申请日期 2002.07.19
申请人 KANSAI TLO KK 发明人 NANISHI YASUSHI;ARAKI TSUTOMU;KAGATSUME HIDETAKA
分类号 H01L21/20;H01L21/203;H01L21/205;H01L21/31;H01L33/12;H01L33/16;H01L33/32;H01S5/323 主分类号 H01L21/20
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