发明名称 |
MULTI-BEAM GENERATOR AND ELECTRON BEAM EXPOSURE SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a multi-beam electron gun which generates a plurality of electron beams which are matched in characteristics. SOLUTION: The multi-beam electron gun 2 is composed of a plurality of electron guns 2a to 2c. The electron gun 2a is equipped with an electron source 21a, a Wehnelt electrode 22a, an anode electrode 23, and furthermore, a shield electrode 24 interposed between the Wehnelt electrode 22a and the anode electrode 23. The shield electrode 24 is capable of reducing electric field interference between the electron guns. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004055613(A) |
申请公布日期 |
2004.02.19 |
申请号 |
JP20020207291 |
申请日期 |
2002.07.16 |
申请人 |
CANON INC;HITACHI LTD;ADVANTEST CORP |
发明人 |
OKUNUKI MASAHIKO;OTA HIROYA;TANIMOTO AKIYOSHI;SAITO NORIO;TAKAKUWA MAKI;HARAGUCHI TAKESHI |
分类号 |
G03F7/20;H01J1/46;H01J3/02;H01J29/46;H01J37/06;H01J37/07;H01J37/09;H01J37/305;H01J37/317;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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