发明名称 Compositions for microlithography
摘要 A fluorine-containing polymer prepared from at least a spacer group selected from the group consisting of ethylene, alpha-olefins, 1,1'-disubstituted olefins, vinyl alcohols, vinyl ethers, and 1,3-dienes; and a norbornyl radical containing a functional group containing the structure: -C(Rf)(Rf')Orb wherein Rf and Rf' are the same or different fluoroalkyl groups of from 1 to about 10 carbon atoms or taken together are (CF2)n wherein n is an integer ranging from 2 to about 10 and Rb is a hydrogen atom or an acid-base-labile protecting group; r is an integer ranging from 0-4. The fluorine-containing polymer has an absorption coefficient of less than 4.0 mm-<1 >at a wavelength of 157 nm. These polymers are useful in photoresist compositions for microlithography. They exhibit high transparency at this short wavelength and also possess other key properties, including good plasma etch resistance and adhesive properties.
申请公布号 US2004033436(A1) 申请公布日期 2004.02.19
申请号 US20030380922 申请日期 2003.03.18
申请人 BERGER LARRY L.;CRAWFORD MICHAEL KARL;FELDMAN JERALD;JOHNSON LYNDA KAYE;SCHADT III FRANK L.;ZUMSTEG JR FREDRICK CLAUS 发明人 BERGER LARRY L.;CRAWFORD MICHAEL KARL;FELDMAN JERALD;JOHNSON LYNDA KAYE;SCHADT III FRANK L.;ZUMSTEG JR FREDRICK CLAUS
分类号 C08F232/08;G03F7/004;G03F7/039;(IPC1-7):G03F7/038 主分类号 C08F232/08
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