发明名称 Microscope auto-focus module comprises beam conditioners for use with a measurement light bundle that is transmitted as a divergent, eccentric annular beam towards the examination object and then reflected from it
摘要 Auto-focus module (30) for a microscope based system (1) has a light source (31) for generating a measurement light bundle (32). A first axial beam conditioner (35a) generates an eccentric, annular divergent measurement light beam (32a), while a second axial beam conditioner (35b) is provided to make the re-emitted divergent light beam (32b) parallel. A differential diode (42) within the auto-focus module is provided for determination of the focal length.
申请公布号 DE10234757(A1) 申请公布日期 2004.02.19
申请号 DE20021034757 申请日期 2002.07.30
申请人 LEICA MICROSYSTEMS SEMICONDUCTOR GMBH 发明人 KREH, ALBERT
分类号 G02B7/32;G02B21/24;(IPC1-7):G02B7/34 主分类号 G02B7/32
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