发明名称 |
Microscope auto-focus module comprises beam conditioners for use with a measurement light bundle that is transmitted as a divergent, eccentric annular beam towards the examination object and then reflected from it |
摘要 |
Auto-focus module (30) for a microscope based system (1) has a light source (31) for generating a measurement light bundle (32). A first axial beam conditioner (35a) generates an eccentric, annular divergent measurement light beam (32a), while a second axial beam conditioner (35b) is provided to make the re-emitted divergent light beam (32b) parallel. A differential diode (42) within the auto-focus module is provided for determination of the focal length.
|
申请公布号 |
DE10234757(A1) |
申请公布日期 |
2004.02.19 |
申请号 |
DE20021034757 |
申请日期 |
2002.07.30 |
申请人 |
LEICA MICROSYSTEMS SEMICONDUCTOR GMBH |
发明人 |
KREH, ALBERT |
分类号 |
G02B7/32;G02B21/24;(IPC1-7):G02B7/34 |
主分类号 |
G02B7/32 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|