发明名称 ERASING METHOD FOR FLASH MEMORY CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an erasing method for a flash memory cell to converge threshold valtage for the cell with constant voltage by changing a method to discharge the flash memory after it is erased in order to perform a recovery process also at the same time when erased. <P>SOLUTION: The erasing method for the flash memory cell consisting of a substrate, a source, a drain, a tunnel oxide film, a floating gate, a dielectric film and a control gate is constituted with a step to perform an erasing process for the cell by applying a negative voltage to the control gate and applying positive voltage of the erasing voltage to the substrate; a step to discharge the control gate by grounding it; a step to discharge the source by grounding it and a step to discharge and recover at the same time by grounding the substrate. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004055109(A) 申请公布日期 2004.02.19
申请号 JP20020363411 申请日期 2002.12.16
申请人 HYNIX SEMICONDUCTOR INC 发明人 TEI SEIBUN;KIN SENJU
分类号 G11C16/02;G11C16/16;G11C16/34;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/02;H01L21/824 主分类号 G11C16/02
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