| 摘要 |
PROBLEM TO BE SOLVED: To provide a specimen fixing table and a specimen inspection method for abridging specimen preparation time when a cross-section TEM (Transmission Electron Microscope) specimen is prepared out of a planar TEM specimen. SOLUTION: This specimen fixing table has an opening part extending from a first face of a rectangular solid to its second face facing on the first face, the rectangular solid being a hexahedron with an outer shape wherein all the adjacent faces cross at right angles. A specimen is fixed on the first or second face so as to partly cover the opening part in the fixing table. COPYRIGHT: (C)2004,JPO
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