| 摘要 |
PROBLEM TO BE SOLVED: To improve redundancy relief efficiency in an integrated circuit provided with a plurality of memory macro-blocks. SOLUTION: A defective address discriminating section 4 stores the addresses of defective memory cells included in a plurality of memory macro-blocks. When an address specified by macro-selecting signals SL1, SL2 and address data ADD coincide with stored addresses, the section 4 outputs defective address detecting signals SDT1, SDT2 indicating stop of data output to the blocks 1, 2 including defective memory cells, and specifies a redundant address RAD to a redundant memory macro-block 3. COPYRIGHT: (C)2004,JPO
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