ELECTRONIC COLUMN NON-UNIFORMITY MEASUREMENT AND COMPENSATION

摘要

Column-to-column display variations active matrix displays are electrically evaluated using column test FETs (177) associated with each column conductor (177). An image signal value is applied to selected columns, and a column conductor voltage produced by application of the image signal value is measured. A comparator (111) switching time for the selected column can be estimated based on the column conductor (177) signal. A column correction value is based on the column conductor signal or the comparator (111) switching time. An active display evaluation system electrically measures comparator differences in one or more columns, and provides one or more display correction values or permits correction values to be revised based on current display properties.