SEMICONDUCTOR MEMORY DEVICE HAVING IMPROVED TEST RELIABILITY

摘要

PURPOSE: A semiconductor memory device having improved test reliability is provided, which enables a test apparatus to recognize pass/fail state of a device to be tested easily. CONSTITUTION: The semiconductor memory device includes a plurality of data output pads, and a memory cell array(120) storing data information, and a sense amplification circuit(140) sensing and amplifying N-bit data from the memory cell array. The first data transfer path outputs a part of the N-bit data to the external through the first representative data output pad among the data output pads during a test mode. A parallel test circuit(220) judges whether the N data bits have an equal value during the test mode. And the second data transfer path outputs an output of the parallel test circuit to the external through the second representative data output pad during the test mode.