发明名称 |
Semiconductor integrated circuit |
摘要 |
A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is led out of the semiconductor integrated circuit through a common external output terminal.
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申请公布号 |
US6693448(B1) |
申请公布日期 |
2004.02.17 |
申请号 |
US20010763495 |
申请日期 |
2001.02.23 |
申请人 |
RENESAS TECHNOLOGY CORPORATION |
发明人 |
OKADA HIDEHIRO;MARUYAMA TETSUYA |
分类号 |
G01R31/28;G01R31/30;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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